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Ultramicroscopy|September 6, 2002
Effect of small crystal tilt on atomic-resolution high-angle annular dark field STEM imagingT Yamazaki, M Kawasaki, K Watanabe, et al.Ultramicroscopy|September 6, 2002
A relocated technique of atomic force microscopy (AFM) samples and its application in molecular biologyAiguo Wu, Zhuang Li, Lihua Yu, et al.Ultramicroscopy|September 5, 2002
An atomic force microscope-based investigation of vertical transport through GaAs/GaAlAs/InAlAs/GaAs step-barrier heterostructuresG Muralidharan, D M Nicholson, S Rajic, et al.Ultramicroscopy|September 5, 2002
Effect of aggregation state on nanotribological behaviors of organosilane monolayersAtsushi Takahara, Ken Kojio, Tisato KajiyamaUltramicroscopy|September 5, 2002
Nanochemical surface analyzer in CMOS technologyW Frank, D Lange, S Lee, et al.Ultramicroscopy|September 5, 2002
Surface modification of an organosilane self-assembled monolayer on silicon substrates using atomic force microscopy: scanning probe electrochemistry toward nanolithographyHiroyuki Sugimura, Takayuki Hanji, Kazuyuki Hayashi, et al.Ultramicroscopy|September 5, 2002
Reversible stretching of a monomeric unit in a dimeric bovine carbonic anhydrase B with the atomic force microscopeTong Wang, Hideo Arakawa, Atsushi IkaiUltramicroscopy|September 5, 2002
Performance of the carbon nano-tube assembled tip for surface shape characterizationM Yasutake, Y Shirakawabe, T Okawa, et al.Ultramicroscopy|January 14, 2003
Imaging of fullerene-like structures in CNx thin films by electron microscopy; sample preparation artefacts due to ion-beam millingZs Czigány, J Neidhardt, I F Brunell, et al.Ultramicroscopy|January 14, 2003
Preparation of flat carbon support filmsRoman I Koning, Gert T Oostergetel, Alain BrissonPageof 460