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Ultramicroscopy|January 5, 2002
Relationships among the physical parameters required to give a linear relation between slope and intercept of Fowler-Nordheim plotsY Gotoh, H Tsuji, J IshikawaUltramicroscopy|January 5, 2002
Field-induced electron emission from electrically nanostructured heterogeneous (ENH) materialsR G ForbesUltramicroscopy|July 26, 2002
A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrationsR R Meyer, A I Kirkland, W O SaxtonUltramicroscopy|July 15, 2000
Structure determination of tubular crystals of membrane proteins. II. Averaging of tubular crystals of different helical classesK Yonekura, C ToyoshimaUltramicroscopy|July 15, 2000
Annular dark-field image simulation of the YBa2Cu3O(7-delta)/BaF2 interfaceLee, SilcoxUltramicroscopy|July 15, 2000
Multiport-readout frame-transfer 5 megapixel CCD imaging system for TEM applicationsG Y Fan, S Peltier, S Lamont, et al.Ultramicroscopy|July 15, 2000
Thermal noise reduction of mechanical oscillators by actively controlled external dissipative forcesLiang, Medich, Czajkowsky, et al.Ultramicroscopy|December 21, 2002
Accuracy of electrostatic lens computations with FOFEMBohumila LencováPageof 460