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Ultramicroscopy|August 13, 2013
Quantifying nanoscale order in amorphous materials via scattering covariance in fluctuation electron microscopyTian T Li, Kristof Darmawikarta, John R AbelsonUltramicroscopy|September 24, 2011
Annular electron energy-loss spectroscopy in the scanning transmission electron microscopeGary Ruben, Michel Bosman, Adrian J D'Alfonso, et al.Ultramicroscopy|October 8, 2011
Optimized Ar(+)-ion milling procedure for TEM cross-section sample preparationLevin Dieterle, Benjamin Butz, Erich MüllerUltramicroscopy|August 26, 2011
Study of the crystallographic architecture of corals at the nanoscale by scanning transmission X-ray microscopy and transmission electron microscopyKarim Benzerara, Nicolas Menguy, Martin Obst, et al.Ultramicroscopy|August 26, 2011
The effect of electron range on electron beam induced current collection and a simple method to extract an electron range for any generation functionA Lahreche, Y Beggah, R CorkishUltramicroscopy|August 26, 2011
Optimizing the driving scheme of a self-actuated atomic force microscope probe for high-speed applicationsM Balantekin, F L DeğertekinUltramicroscopy|August 26, 2011
Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffractionT B Britton, A J WilkinsonUltramicroscopy|August 26, 2011
Detection of buried reference structures by use of atomic force acoustic microscopyAndre Striegler, Bernd Koehler, Beatrice Bendjus, et al.Ultramicroscopy|August 26, 2011
Investigation of morphological and functional changes during neuronal differentiation of PC12 cells by combined hopping probe ion conductance microscopy and patch-clamp techniqueXi Yang, Xiao Liu, Xiaofan Zhang, et al.Ultramicroscopy|September 21, 2011
Direct exit-wave reconstruction from a single defocused imageA J Morgan, A V Martin, A J D'Alfonso, et al.Pageof 460