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Ultramicroscopy|September 21, 2011
High precision measurements of atom column positions using model-based exit wave reconstructionA De Backer, S Van Aert, D Van DyckUltramicroscopy|September 21, 2011
Diffraction contrast STEM of dislocations: imaging and simulationsP J Phillips, M C Brandes, M J Mills, et al.Ultramicroscopy|September 21, 2011
A new approach for 3D reconstruction from bright field TEM imaging: beam precession assisted electron tomographyJ M Rebled, Ll Yedra, S Estradé, et al.Ultramicroscopy|October 4, 2011
Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopyPeter Hermann, Michael Hecker, Dmytro Chumakov, et al.Ultramicroscopy|January 27, 2012
Complementary microscopy techniques applied for optimizing the structure and performance of graphene-based hybridsWen Qian, Zhiqiang Chen, Micah Eastman, et al.Ultramicroscopy|January 14, 2012
Examples of electrostatic electron optics: the Farrand and Elektros microscopes and electron mirrorsP W HawkesUltramicroscopy|March 31, 2012
Optimization of Q-factor of AFM cantilevers using genetic algorithmsAngel Perez-Cruz, Aurelio Dominguez-Gonzalez, Ion Stiharu, et al.Ultramicroscopy|March 27, 2012
Estimation of the electron beam-induced specimen heating and the emitted X-rays spatial resolution by Kossel microdiffraction in a scanning electron microscopeDenis Bouscaud, Raphaël Pesci, Sophie Berveiller, et al.Ultramicroscopy|March 27, 2012
Effect of the tip-sample contact force on the nanostructure size fabricated by local oxidation nanolithographyKexiang Hu, Sen Wu, Maomao Huang, et al.Ultramicroscopy|March 31, 2000
A novel cleaning method of gold-coated atomic force microscope tips for their chemical modificationFujihira, Okabe, Tani, et al.Pageof 460