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Ultramicroscopy|January 16, 2013
Field evaporation of oxides: a theoretical studyMarkus Karahka, H J KreuzerUltramicroscopy|February 24, 2012
Sample preparation for atomic-resolution STEM at low voltages by FIBMiroslava Schaffer, Bernhard Schaffer, Quentin RamasseUltramicroscopy|September 16, 2014
Three-wave electron vortex lattices for measuring nanofieldsC Dwyer, C B Boothroyd, S L Y Chang, et al.Ultramicroscopy|June 18, 2013
To tilt or not to tilt: correction of the distortion caused by inclined sample surfaces in low-energy electron diffractionFalko Sojka, Matthias Meissner, Christian Zwick, et al.Ultramicroscopy|June 18, 2013
Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinumJason Brown, Paul Kocher, Chandra S Ramanujan, et al.Ultramicroscopy|April 30, 2013
Applying computational geometry techniques for advanced feature analysis in atom probe dataPeter Felfer, Anna Ceguerra, Simon Ringer, et al.Ultramicroscopy|June 12, 2013
Boundary identification in EBSD data with a generalization of fast multiscale clusteringCullen McMahon, Brian Soe, Andrew Loeb, et al.Ultramicroscopy|June 6, 2013
Comments on the paper "A comprehensive modeling and vibration analysis of AFM microcantilevers subjected to nonlinear tip-sample interaction forces" by Sohrab Eslami and Nader JaliliAli Passian, Laurene Tetard, Thomas ThundatPageof 460