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Ultramicroscopy|November 12, 2015
Simulation of the enhancement factor from an individual 3D hemisphere-on-post field emitter by using finite elements methodD S Roveri, G M Sant'Anna, H H Bertan, et al.Ultramicroscopy|December 17, 2013
On artefact-free reconstruction of low-energy (30-250eV) electron hologramsTatiana Latychevskaia, Jean-Nicolas Longchamp, Conrad Escher, et al.Ultramicroscopy|June 5, 2012
A comprehensive modeling and vibration analysis of AFM microcantilevers subjected to nonlinear tip-sample interaction forcesSohrab Eslami, Nader JaliliUltramicroscopy|November 23, 2013
High-precision correlative fluorescence and electron cryo microscopy using two independent alignment markersPascale Schellenberger, Rainer Kaufmann, C Alistair Siebert, et al.Ultramicroscopy|October 22, 2013
3D spatial resolution improvement by dual-axis electron tomography: application to tri-gate transistorsGeorg Haberfehlner, Raphaël Serra, David Cooper, et al.Ultramicroscopy|August 27, 2014
Transfer and reconstruction of the density matrix in off-axis electron holographyFalk Röder, Axel LubkUltramicroscopy|September 6, 2014
A compact high field magnetic force microscopeHaibiao Zhou, Ze Wang, Yubin Hou, et al.Ultramicroscopy|August 30, 2014
In situ electron holographic study of Ionic liquidManabu Shirai, Toshiaki Tanigaki, Shinji Aizawa, et al.Ultramicroscopy|December 4, 2014
Modelling the inelastic scattering of fast electronsL J Allen, A J D Alfonso, S D FindlayUltramicroscopy|December 3, 2015
Fabrication of tungsten probe for hard tapping operation in atomic force microscopyGuebum Han, Hyo-Sok AhnPageof 460