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Ultramicroscopy|December 7, 2007
Coupled lateral bending-torsional vibration sensitivity of atomic force microscope cantileverHaw-Long Lee, Win-Jin ChangUltramicroscopy|December 11, 2007
Shape dependence of the capacitance of scanning capacitance microscope probesS LányiUltramicroscopy|December 11, 2007
Near-field scanning optical microscope probe analysisPetr Klapetek, Jirí Bursík, Miroslav Valtr, et al.Ultramicroscopy|March 28, 2006
Structure analysis of embedded nano-sized particles by precession electron diffraction. eta'-precipitate in an Al-Zn-Mg alloy as exampleA Kverneland, V Hansen, R Vincent, et al.Ultramicroscopy|March 8, 2006
Energy dissipation and frequency shift of a damped dynamic force microscopyShueei Muh LinUltramicroscopy|November 9, 2016
Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopyZ Chen, D J Taplin, M Weyland, et al.Ultramicroscopy|April 29, 2014
Magnetic domain structure and crystallographic orientation of electrical steels revealed by a forescatter detector and electron backscatter diffractionMatthew Gallaugher, Nicolas Brodusch, Raynald Gauvin, et al.Ultramicroscopy|February 15, 2014
A novel low energy electron microscope for DNA sequencing and surface analysisM Mankos, K Shadman, H H J Persson, et al.Ultramicroscopy|February 15, 2014
Helium ion microscopy based wall thickness and surface roughness analysis of polymer foams obtained from high internal phase emulsionC Rodenburg, P Viswanathan, M A E Jepson, et al.Ultramicroscopy|February 26, 2014
Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope imagesZ Lee, H Rose, O Lehtinen, et al.Pageof 460