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Ultramicroscopy|March 11, 2008
Accuracy and precision in model based EELS quantificationG Bertoni, J Verbeeck
Ultramicroscopy|February 25, 2014
Time-resolved measurement of the three-dimensional motion of gold nanocrystals in water using diffracted electron trackingNaoki Ogawa, Yasuhisa Hirohata, Yuji C Sasaki, et al.
Ultramicroscopy|May 24, 2008
Cryo-EM image alignment based on nonuniform fast Fourier transformZhengfan Yang, Pawel A Penczek
Ultramicroscopy|October 1, 2016
Preventing probe induced topography correlated artifacts in Kelvin Probe Force MicroscopyLeo Polak, Rinke J Wijngaarden
Ultramicroscopy|October 4, 2016
Magnetic properties of single nanomagnets: Electron energy-loss magnetic chiral dichroism on FePt nanoparticlesSebastian Schneider, Darius Pohl, Stefan Löffler, et al.
Ultramicroscopy|April 29, 2014
Successful application of Low Voltage Electron Microscopy to practical materials problemsDavid C Bell, Max Mankin, Robert W Day, et al.
Ultramicroscopy|April 6, 2017
Vibrational and valence aloof beam EELS: A potential tool for nondestructive characterization of nanoparticle surfacesPeter A Crozier
Ultramicroscopy|April 6, 2017
Scattering delocalization and radiation damage in STEM-EELSR F Egerton
Ultramicroscopy|January 28, 2017
Significance of matrix diagonalization in modelling inelastic electron scatteringZ Lee, R Hambach, U Kaiser, et al.
Ultramicroscopy|February 7, 2017
Optimizing disk registration algorithms for nanobeam electron diffraction strain mappingThomas C Pekin, Christoph Gammer, Jim Ciston, et al.
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