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Ultramicroscopy|July 25, 2016
Photogrammetry of the three-dimensional shape and texture of a nanoscale particle using scanning electron microscopy and free softwareLionel C Gontard, Roland Schierholz, Shicheng Yu, et al.Ultramicroscopy|December 1, 1975
A specimen preparation technique for transmission electron microscopy of surface layersS Hogmark, H Swahn, O VingsboUltramicroscopy|July 21, 2001
Image-spectroscopy--I. The advantages of increased spectral information for compositional EFTEM analysisP J Thomas, P A MidgleyUltramicroscopy|July 21, 2001
Contamination and the quantitative exploitation of EELS low-loss experimentsS Schamm, G ZanchiUltramicroscopy|July 1, 1992
Na,K-ATPase in crystalline form investigated by scanning force microscopyH J Apell, J Colchero, A Linder, et al.Ultramicroscopy|October 1, 1992
Magnification mismatches between micrographs: corrective procedures and implications for structural analysisA Aldroubi, B L Trus, M Unser, et al.Ultramicroscopy|October 1, 1992
Three-dimensional reconstruction of single particles negatively stained or in vitreous iceJ Frank, M RadermacherUltramicroscopy|June 8, 2001
Method of linearizing the 3d L3/L2 white line ratio as a function of magnetic momentD M Pease, A Fasihuddin, M Daniel, et al.Ultramicroscopy|June 8, 2001
Compositional analysis based on electron holography and a chemically sensitive reflectionA Rosenauer, D Van Dyck, M Arzberger, et al.Pageof 460