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Ultramicroscopy
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July 25, 2016
Photogrammetry of the three-dimensional shape and texture of a nanoscale particle using scanning electron microscopy and free software
Lionel C Gontard, Roland Schierholz, Shicheng Yu, et al.
Ultramicroscopy
|
December 1, 1975
A specimen preparation technique for transmission electron microscopy of surface layers
S Hogmark, H Swahn, O Vingsbo
Ultramicroscopy
|
July 21, 2001
Image-spectroscopy--I. The advantages of increased spectral information for compositional EFTEM analysis
P J Thomas, P A Midgley
Ultramicroscopy
|
July 21, 2001
Contamination and the quantitative exploitation of EELS low-loss experiments
S Schamm, G Zanchi
Ultramicroscopy
|
July 1, 1992
Na,K-ATPase in crystalline form investigated by scanning force microscopy
H J Apell, J Colchero, A Linder, et al.
Ultramicroscopy
|
October 1, 1992
Magnification mismatches between micrographs: corrective procedures and implications for structural analysis
A Aldroubi, B L Trus, M Unser, et al.
Ultramicroscopy
|
October 1, 1992
Three-dimensional reconstruction of single particles negatively stained or in vitreous ice
J Frank, M Radermacher
Ultramicroscopy
|
June 8, 2001
Method of linearizing the 3d L3/L2 white line ratio as a function of magnetic moment
D M Pease, A Fasihuddin, M Daniel, et al.
Ultramicroscopy
|
June 8, 2001
Compositional analysis based on electron holography and a chemically sensitive reflection
A Rosenauer, D Van Dyck, M Arzberger, et al.
Ultramicroscopy
|
May 2, 2001
Heating of TEM specimens during ion milling
B Viguier, A Mortensen
Page
of 458
Search research articles
Search
Showing results (441-450 of 4,574) with videos related to
Sort By:
Page
of 458
Ultramicroscopy
|
July 25, 2016
Photogrammetry of the three-dimensional shape and texture of a nanoscale particle using scanning electron microscopy and free software
Lionel C Gontard, Roland Schierholz, Shicheng Yu, et al.
Ultramicroscopy
|
December 1, 1975
A specimen preparation technique for transmission electron microscopy of surface layers
S Hogmark, H Swahn, O Vingsbo
Ultramicroscopy
|
July 21, 2001
Image-spectroscopy--I. The advantages of increased spectral information for compositional EFTEM analysis
P J Thomas, P A Midgley
Ultramicroscopy
|
July 21, 2001
Contamination and the quantitative exploitation of EELS low-loss experiments
S Schamm, G Zanchi
Ultramicroscopy
|
July 1, 1992
Na,K-ATPase in crystalline form investigated by scanning force microscopy
H J Apell, J Colchero, A Linder, et al.
Ultramicroscopy
|
October 1, 1992
Magnification mismatches between micrographs: corrective procedures and implications for structural analysis
A Aldroubi, B L Trus, M Unser, et al.
Ultramicroscopy
|
October 1, 1992
Three-dimensional reconstruction of single particles negatively stained or in vitreous ice
J Frank, M Radermacher
Ultramicroscopy
|
June 8, 2001
Method of linearizing the 3d L3/L2 white line ratio as a function of magnetic moment
D M Pease, A Fasihuddin, M Daniel, et al.
Ultramicroscopy
|
June 8, 2001
Compositional analysis based on electron holography and a chemically sensitive reflection
A Rosenauer, D Van Dyck, M Arzberger, et al.
Ultramicroscopy
|
May 2, 2001
Heating of TEM specimens during ion milling
B Viguier, A Mortensen
Page
of 458