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Ultramicroscopy

Showing results (471-480 of 4,574) with videos related to

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Ultramicroscopy|November 1, 1992
Radial mass density functions of vitrified helical specimens determined by scanning transmission electron microscopy: their potential use as substitutes for equatorial dataS Trachtenberg, K R Leonard, W Tichelaar
Ultramicroscopy|March 8, 2003
Determination of the mean inner potential in III-V semiconductors by electron holographyP Kruse, A Rosenauer, D Gerthsen
Ultramicroscopy|March 8, 2003
A method to determine long-range order parameters from electron diffraction intensities detected by a CCD cameraTakayoshi Kimoto, Toshiyuki Takeda, Shigenari Shida
Ultramicroscopy|April 4, 2003
Polycrystal orientation maps from TEMJ-J Fundenberger, A Morawiec, E Bouzy, et al.
Ultramicroscopy|April 4, 2003
Experimental study of ELNES at grain boundaries in alumina: intergranular radiation damage effects on Al-L23 and O-K edgesDanièle Bouchet, Christian Colliex
Ultramicroscopy|April 4, 2003
Automated image processing for grain boundary analysisSowmya Mahadevan, David Casasent
Ultramicroscopy|January 1, 1984
Computer image modeling of pentamer packing in polyoma virus "hexamer" tubesT S Baker, D L Caspar
Ultramicroscopy|January 1, 1981
On the negative straining of the protein crystal structureM B Sherman, E V Orlova, S S Terzyan, et al.
Ultramicroscopy|January 1, 1981
Improved visualization of single- and double-strained nucleic acids by STEMC Mory, C Colliex, B Revet, et al.
Ultramicroscopy|November 10, 2018
A continuous sampling pattern design algorithm for atomic force microscopy imagesYufan Luo, Sean B Andersson
Pageof 458

Showing results (471-480 of 4,574) with videos related to

Sort By:
Pageof 458
Ultramicroscopy|November 1, 1992
Radial mass density functions of vitrified helical specimens determined by scanning transmission electron microscopy: their potential use as substitutes for equatorial dataS Trachtenberg, K R Leonard, W Tichelaar
Ultramicroscopy|March 8, 2003
Determination of the mean inner potential in III-V semiconductors by electron holographyP Kruse, A Rosenauer, D Gerthsen
Ultramicroscopy|March 8, 2003
A method to determine long-range order parameters from electron diffraction intensities detected by a CCD cameraTakayoshi Kimoto, Toshiyuki Takeda, Shigenari Shida
Ultramicroscopy|April 4, 2003
Polycrystal orientation maps from TEMJ-J Fundenberger, A Morawiec, E Bouzy, et al.
Ultramicroscopy|April 4, 2003
Experimental study of ELNES at grain boundaries in alumina: intergranular radiation damage effects on Al-L23 and O-K edgesDanièle Bouchet, Christian Colliex
Ultramicroscopy|April 4, 2003
Automated image processing for grain boundary analysisSowmya Mahadevan, David Casasent
Ultramicroscopy|January 1, 1984
Computer image modeling of pentamer packing in polyoma virus "hexamer" tubesT S Baker, D L Caspar
Ultramicroscopy|January 1, 1981
On the negative straining of the protein crystal structureM B Sherman, E V Orlova, S S Terzyan, et al.
Ultramicroscopy|January 1, 1981
Improved visualization of single- and double-strained nucleic acids by STEMC Mory, C Colliex, B Revet, et al.
Ultramicroscopy|November 10, 2018
A continuous sampling pattern design algorithm for atomic force microscopy imagesYufan Luo, Sean B Andersson
Pageof 458