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Ultramicroscopy|June 24, 2008
Characterization of nanoscale recording mark on Ge2Sb2Te5 filmJunHo Kim, Myeung Hoi Kwon, Ki-Bong SongUltramicroscopy|June 25, 2008
Pushing the boundaries of local oxidation nanolithography: short timescales and high speedsJ A Vicary, M J MilesUltramicroscopy|December 5, 2006
Electron imaging with Medipix2 hybrid pixel detectorG McMullan, D M Cattermole, S Chen, et al.Ultramicroscopy|October 4, 2006
Image distortions in SEM and their influences on EBSD measurementsGert NolzeUltramicroscopy|October 13, 2006
EFTEM assistant: a tool to understand the limitations of EFTEMS Lozano-Perez, J M TitchmarshUltramicroscopy|July 3, 2004
Direct measurement of tapping force with a cantilever deflection force sensorChanmin Su, Lin Huang, Kevin KjollerUltramicroscopy|July 3, 2004
Rigid design of fast scanning probe microscopes using finite element analysisJohannes H Kindt, Georg E Fantner, Jackie A Cutroni, et al.Ultramicroscopy|July 3, 2004
Identification of the first nucleated phase in submonolayer Ti deposited on Si(111)-7 x 7 by atomic resolution techniquesH F Hsu, H C Hsu, T F Chiang, et al.Ultramicroscopy|July 3, 2004
Observation of removal of an Fmoc protecting group by scanning tunneling microscopyH Kudo, Y Okamoto, K J Kwak, et al.Ultramicroscopy|July 3, 2004
Resonant excitation of tip plasmons for tip-enhanced Raman SNOMFrederic Festy, Anna Demming, David RichardsPageof 460