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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

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Rigid design of fast scanning probe microscopes using finite element analysis

Johannes H Kindt1, Georg E Fantner, Jackie A Cutroni

  • 1Department of Physics, University of California, Santa Barbara, CA 93106, USA. kindt@physics.ucsb.edu

Ultramicroscopy
|July 3, 2004
PubMed

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