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Ultramicroscopy|August 2, 2008
TEM analyses of synthetic anti-ferromagnetic (SAF) nanoparticles fabricated using different release layersAi Leen Koh, Wei Hu, Robert John Wilson, et al.Ultramicroscopy|August 2, 2008
Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopesVarat Intaraprasonk, Huolin L Xin, David A MullerUltramicroscopy|September 26, 2008
Column ratio mapping: a processing technique for atomic resolution high-angle annular dark-field (HAADF) imagesPaul D Robb, Alan J CravenUltramicroscopy|September 14, 2016
Custom sample environments at the ALBA XPEEMMichael Foerster, Jordi Prat, Valenti Massana, et al.Ultramicroscopy|May 11, 1989
Imaging of metal-coated biological samples by scanning tunneling microscopyR Garcia, D Keller, J Panitz, et al.Ultramicroscopy|February 13, 2010
Investigation of integrin expression on the surface of osteoblast-like cells by atomic force microscopyFederico Caneva Soumetz, Jose F Saenz, Laura Pastorino, et al.Ultramicroscopy|May 29, 2017
Photonic and plasmonic surface field distributions characterized with normal- and oblique-incidence multi-photon PEEMRobert C Word, Rolf KönenkampUltramicroscopy|May 29, 2017
Diffraction contrast dependence on sample thickness and incident energy in on-axis Transmission Kikuchi Diffraction in SEME Brodu, E Bouzy, J-J FundenbergerUltramicroscopy|March 2, 2010
Step response measurement of AFM cantilever for analysis of frequency-resolved viscoelasticityTatsuya Ogawa, Shinkichi Kurachi, Masami Kageshima, et al.Ultramicroscopy|March 5, 2010
Distinction of heterogeneity on Au nanostructured surface based on phase contrast imaging of atomic force microscopyMi Jung, Jeong-Woo ChoiPageof 460