Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ultramicroscopy

Showing results (571-580 of 4,574) with videos related to

Pageof 458
Sort By:
Ultramicroscopy|March 16, 2010
Real-time atomic force microscopy in lubrication conditionHyunsoo Lee, Donghyeok Lee, K B Kim, et al.
Ultramicroscopy|April 28, 2017
Note on in situ (scanning) transmission electron microscopy study of liquid samplesNan Jiang
Ultramicroscopy|April 28, 2017
Consequences of the CMR effect on EELS in TEMWolfgang Wallisch, Michael Stöger-Pollach, Edvinas Navickas
Ultramicroscopy|March 6, 2010
Drift study of SU8 cantilevers in liquid and gaseous environmentsMaria Tenje, Stephan Keller, Søren Dohn, et al.
Ultramicroscopy|March 6, 2010
Scanning probe microscope based Deep-Level Spectroscopy of semiconductor filmsS Lányi, V Nádazdy
Ultramicroscopy|March 9, 2010
Nanoscale dielectric properties of insulating thin films: from single point measurements to quantitative imagesC Riedel, G A Schwartz, R Arinero, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
Ultramicroscopy|May 26, 2018
Image formation in the scanning helium microscopeA Fahy, S D Eder, M Barr, et al.
Ultramicroscopy|July 14, 2018
Theoretical framework of statistical noise in scanning transmission electron microscopyTakehito Seki, Yuichi Ikuhara, Naoya Shibata
Ultramicroscopy|July 15, 2018
New approach in Auger elemental relative sensitive factor calculation by using TEM-EDS analysis based on bi-layers of pure elementsD Mello, M Nacucchi, G Anastasi, et al.
Pageof 458

Showing results (571-580 of 4,574) with videos related to

Sort By:
Pageof 458
Ultramicroscopy|March 16, 2010
Real-time atomic force microscopy in lubrication conditionHyunsoo Lee, Donghyeok Lee, K B Kim, et al.
Ultramicroscopy|April 28, 2017
Note on in situ (scanning) transmission electron microscopy study of liquid samplesNan Jiang
Ultramicroscopy|April 28, 2017
Consequences of the CMR effect on EELS in TEMWolfgang Wallisch, Michael Stöger-Pollach, Edvinas Navickas
Ultramicroscopy|March 6, 2010
Drift study of SU8 cantilevers in liquid and gaseous environmentsMaria Tenje, Stephan Keller, Søren Dohn, et al.
Ultramicroscopy|March 6, 2010
Scanning probe microscope based Deep-Level Spectroscopy of semiconductor filmsS Lányi, V Nádazdy
Ultramicroscopy|March 9, 2010
Nanoscale dielectric properties of insulating thin films: from single point measurements to quantitative imagesC Riedel, G A Schwartz, R Arinero, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
Ultramicroscopy|May 26, 2018
Image formation in the scanning helium microscopeA Fahy, S D Eder, M Barr, et al.
Ultramicroscopy|July 14, 2018
Theoretical framework of statistical noise in scanning transmission electron microscopyTakehito Seki, Yuichi Ikuhara, Naoya Shibata
Ultramicroscopy|July 15, 2018
New approach in Auger elemental relative sensitive factor calculation by using TEM-EDS analysis based on bi-layers of pure elementsD Mello, M Nacucchi, G Anastasi, et al.
Pageof 458