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Ultramicroscopy|March 16, 2010
Real-time atomic force microscopy in lubrication conditionHyunsoo Lee, Donghyeok Lee, K B Kim, et al.Ultramicroscopy|April 28, 2017
Note on in situ (scanning) transmission electron microscopy study of liquid samplesNan JiangUltramicroscopy|April 28, 2017
Consequences of the CMR effect on EELS in TEMWolfgang Wallisch, Michael Stöger-Pollach, Edvinas NavickasUltramicroscopy|March 6, 2010
Drift study of SU8 cantilevers in liquid and gaseous environmentsMaria Tenje, Stephan Keller, Søren Dohn, et al.Ultramicroscopy|March 6, 2010
Scanning probe microscope based Deep-Level Spectroscopy of semiconductor filmsS Lányi, V NádazdyUltramicroscopy|March 9, 2010
Nanoscale dielectric properties of insulating thin films: from single point measurements to quantitative imagesC Riedel, G A Schwartz, R Arinero, et al.Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.Ultramicroscopy|May 26, 2018
Image formation in the scanning helium microscopeA Fahy, S D Eder, M Barr, et al.Ultramicroscopy|July 14, 2018
Theoretical framework of statistical noise in scanning transmission electron microscopyTakehito Seki, Yuichi Ikuhara, Naoya ShibataUltramicroscopy|July 15, 2018
New approach in Auger elemental relative sensitive factor calculation by using TEM-EDS analysis based on bi-layers of pure elementsD Mello, M Nacucchi, G Anastasi, et al.Pageof 460