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Theoretical framework of statistical noise in scanning transmission electron microscopy

Takehito Seki1, Yuichi Ikuhara2, Naoya Shibata2

  • 1Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo 113-8656, Japan.

Ultramicroscopy
|July 14, 2018
PubMed

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