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Ultramicroscopy|November 11, 2008
Electron microscopy localization and characterization of functionalized composite organic-inorganic SERS nanoparticles on leukemia cellsAi Leen Koh, Catherine M Shachaf, Sailaja Elchuri, et al.Ultramicroscopy|April 3, 2009
Real space maps of atomic transitionsP Schattschneider, J Verbeeck, A L HamonUltramicroscopy|February 17, 2009
Image simulation of high resolution energy filtered TEM imagesJo Verbeeck, Peter Schattschneider, Andreas RosenauerUltramicroscopy|May 11, 2010
The role of helium ion microscopy in the characterisation of complex three-dimensional nanostructuresC Rodenburg, X Liu, M A E Jepson, et al.Ultramicroscopy|May 11, 2010
Characterization of MEMS piezoresistive pressure sensors using AFMSuraj K Patil, Zeynep Celik-Butler, Donald P ButlerUltramicroscopy|April 23, 2010
Direct space structure solution from precession electron diffraction data: Resolving heavy and light scatterers in Pb(13)Mn(9)O(25)Joke Hadermann, Artem M Abakumov, Alexander A Tsirlin, et al.Ultramicroscopy|April 3, 2010
Characterization of the electrical and optical properties of viologen devices using chlorophyll a as an electron excimerNam-Suk Lee, Hoon-Kyu Shin, Young-Soo Kwon, et al.Ultramicroscopy|June 5, 2009
Structural imaging of beta-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopyZaoli Zhang, Ute KaiserUltramicroscopy|June 5, 2009
Controlling tip-sample interaction forces during a single tap for improved topography and mechanical property imaging of soft materials by AFMZehra Parlak, Rameen Hadizadeh, Mujdat Balantekin, et al.Ultramicroscopy|June 9, 2009
Quantitative measurements of Kikuchi bands in diffraction patterns of backscattered electrons using an electrostatic analyzerM R Went, A Winkelmann, M VosPageof 460