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Ultramicroscopy|December 20, 2015
Large volume serial section tomography by Xe Plasma FIB dual beam microscopyT L Burnett, R Kelley, B Winiarski, et al.Ultramicroscopy|December 22, 2015
The Ettention software packageTim Dahmen, Lukas Marsalek, Nico Marniok, et al.Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.Ultramicroscopy|October 21, 2015
A novel 3D absorption correction method for quantitative EDX-STEM tomographyPierre Burdet, Z Saghi, A N Filippin, et al.Ultramicroscopy|October 19, 2015
Addressing preservation of elastic contrast in energy-filtered transmission electron microscopyH G Brown, A J D'Alfonso, B D Forbes, et al.Ultramicroscopy|January 10, 2015
Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamicsPeter Mølgaard Mortensen, Thomas Willum Hansen, Jakob Birkedal Wagner, et al.Ultramicroscopy|December 16, 2014
The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopyNestor J ZaluzecUltramicroscopy|December 2, 2014
Sub-micron resolution selected area electron channeling patternsJ Guyon, H Mansour, N Gey, et al.Pageof 460