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Ultramicroscopy|June 6, 2021
Ultramicrotomy preparation of magnetic nanoparticles for transmission electron microscopyLongchun Bian, Qiue Cao, Liyan Zheng, et al.Ultramicroscopy|May 29, 2021
Quantifying the performance of a hybrid pixel detector with GaAs:Cr sensor for transmission electron microscopyKirsty A Paton, Matthew C Veale, Xiaoke Mu, et al.Ultramicroscopy|September 28, 2020
Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materialsYu Yuan, Hendrix Demers, Nicolas Brodusch, et al.Ultramicroscopy|December 15, 2020
Support vector machine for EELS oxidation state determinationD Del-Pozo-Bueno, F Peiró, S EstradéUltramicroscopy|December 15, 2020
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challengesHans Vanrompay, Alexander Skorikov, Eva Bladt, et al.Ultramicroscopy|December 21, 2020
A simple method to clean ligand contamination on TEM gridsChen Li, Adrian Pedrazo Tardajos, Da Wang, et al.Ultramicroscopy|December 10, 2020
Investigation of gas-electron interactions with electron holographyJes Ærøe Hyllested, Marco BeleggiaUltramicroscopy|September 12, 2022
A precision core drill for transmission electron microscopy sample preparation produced by 3D printingLawrence WhitmoreUltramicroscopy|November 27, 2021
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applicationsD Jannis, C Hofer, C Gao, et al.Pageof 460