Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Longda Zhou

1PUBLICATIONS

5CO-AUTHORS

Experimental methods in fluid flow, heat and mass transfer

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (1)

Sort by Publication Date:

|Apr 13, 2023

Insight into over Repair of Hot Carrier Degradation by GIDL Current in Si p-FinFETs Using Ultra-Fast Measurement Technique.

Hao Chang, Guilei Wang, Hong Yang

Pageof 1

Frequent Collaborators

1 joint publications

Hao Chang

1 joint publications

Hong Yang

1 joint publications

Zhenhua Wu

1 joint publications

Huaxiang Yin

1 joint publications

Jun Luo

Frequent Collaborators

1 joint publications

Hao Chang

1 joint publications

Hong Yang

1 joint publications

Zhenhua Wu

1 joint publications

Huaxiang Yin

Top Related Videos

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on : Apr 18, 2019

See more related videos

Top Related Videos

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on : Apr 18, 2019

See more related videos