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Enxu Liu, Junjie Li, Na Zhou
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High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
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Tuning Oxide Properties by Oxygen Vacancy Control During Growth and Annealing
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