N Bartlett

2PUBLICATIONS
22CO-AUTHORS
Instruments and techniquesProcess control and simulation
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Publications (2)

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|Oct 13, 2026
Development and performance of a university-scale extreme ultraviolet (EUV) lithography source.

|Aug 06, 2024
Results from a synthetic model of the ITER XRCS-Core diagnostic based on high-fidelity x-ray ray tracing.

N A Pablant, Z Cheng, M O'Mullane

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N A Pablant

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Z Cheng

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L Gao

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M Bitter

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E Bourcart

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G V Brown

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L F Delgado-Aparicio

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C Dunn

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A J Fairchild

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N A Pablant

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Z Cheng

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M O'Mullane

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L Gao

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