Kin Leong Pey
6PUBLICATIONS
17CO-AUTHORS
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Publications (6)
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|Sep 04, 2025
Microscopic Analysis of Degradation and Breakdown Kinetics in HfO2 Gate Dielectric after Ions Irradiation.Andrea Padovani, Paolo La Torraca, Fernando L Aguirre
|Sep 02, 2022
Super-resolution laser probing of integrated circuits using algorithmic methods.V K Ravikumar, Jiann Min Chin, Winson Lua
|May 28, 2022
Silicon-Controlled Rectifier Embedded Diode for 7 nm FinFET Process Electrostatic Discharge Protection.Xinyu Zhu, Shurong Dong, Fangjun Yu
|Nov 03, 2021
Standards for the Characterization of Endurance in Resistive Switching Devices.Mario Lanza, Rainer Waser, Daniele Ielmini
|Dec 01, 2020
Localized Probing of Dielectric Breakdown in Multilayer Hexagonal Boron Nitride.Alok Ranjan, Sean J O'Shea, Michel Bosman
|Feb 14, 2018
Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films.A Ranjan, N Raghavan, S J O'Shea
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Frequent Collaborators
3 joint publications
Alok Ranjan
3 joint publications
Nagarajan Raghavan
1 joint publications
Jonathan Trisno
1 joint publications
Joel K W Yang
1 joint publications
Andrea Padovani
1 joint publications
Francesco M Puglisi
1 joint publications
Sean J O'Shea
1 joint publications
Michel Bosman
1 joint publications
Mario Lanza
1 joint publications
Sabina Spiga
