Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Lin Peng

2PUBLICATIONS

1CO-AUTHORS

Instruments and techniquesPower electronics

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (2)

Sort by Publication Date:

|Aug 28, 2025

A 28 mK Resolution, -0.45 °C/+0.51 °C Inaccuracy Temperature Sensor Using Dual-Comparator Architecture and Logic-Controlled Counting Method.

Yubin Xu, Tongyu Luo, Lin Peng

|Jan 21, 2023

An Efficient 24-30 GHz GaN-on-Si Driver Amplifier Using Synthesized Matching Networks.

Lin Peng, Jing Yan, Zhihao Zhang

Pageof 1

Frequent Collaborators

1 joint publications

Zhihao Zhang

Frequent Collaborators

1 joint publications

Zhihao Zhang

Top Related Videos

Method for Simultaneous fMRI/EEG Data Collection during a Focused Attention Suggestion for Differential Thermal Sensation

Method for Simultaneous fMRI/EEG Data Collection during a Focused Attention Suggestion for Differential Thermal Sensation

Published on : Jan 05, 2014

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on : Apr 01, 2020

See more related videos

Top Related Videos

Method for Simultaneous fMRI/EEG Data Collection during a Focused Attention Suggestion for Differential Thermal Sensation

Method for Simultaneous fMRI/EEG Data Collection during a Focused Attention Suggestion for Differential Thermal Sensation

Published on : Jan 05, 2014

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on : Apr 01, 2020

See more related videos