Muyoung Kim

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Publications (2)
Seunghwan Lee, Yonggyun Park, Pengzhan Liu
Soon-Chun Chung, Joon-Song Park, Rakesh Kumar Jha

Get your video featured.

Get your video featured.
Seunghwan Lee, Yonggyun Park, Pengzhan Liu
Soon-Chun Chung, Joon-Song Park, Rakesh Kumar Jha

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015

Reactive Inkjet Printing and Propulsion Analysis of Silk-based Self-propelled Micro-stirrers
Published on : Apr 26, 2019