Tanveerul Haq
3PUBLICATIONS
4CO-AUTHORS
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Publications (3)
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|Nov 25, 2023
New Complementary Resonator for Permittivity- and Thickness-Based Dielectric Characterization.Tanveerul Haq, Slawomir Koziel
|Apr 03, 2020
Extremely Sensitive Microwave Sensor for Evaluation of Dielectric Characteristics of Low-Permittivity Materials.Tanveerul Haq, Cunjun Ruan, Xingyun Zhang
|May 10, 2019
Complementary Metamaterial Sensor for Nondestructive Evaluation of Dielectric Substrates.Tanveer Ul Haq, Cunjun Ruan, Xingyun Zhang
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