Alexandra Delvallée

9PUBLICATIONS
34CO-AUTHORS
Powder and particle technologyNanoscale characterisationWearable materialsElemental semiconductorsCondensed matter characterisation technique development
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Publications (9)

|Dec 24, 2025
Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study-Sample Preparation and Stability Issues.

Lydia Chibane, Alexandra Delvallée, Nolwenn Fleurence

|Jun 13, 2024
Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM.

Nicolas Feltin, Alexandra Delvallée, Loïc Crouzier

|Jun 04, 2024
Characterisation of titanium dioxide (nano)particles in foodstuffs and E171 additives by single particle inductively coupled plasma-tandem mass spectrometry using a highly efficient sample introduction system.

Isabel Bastardo-Fernández, Rachida Chekri, Johanna Noireaux

|Mar 29, 2023
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles.

Nicolas Feltin, Loïc Crouzier, Alexandra Delvallée

|Feb 27, 2023
Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison.

Tianjia Bu, Huifang Gao, Yaxuan Yao

|Nov 27, 2021
Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy.

Damien Richert, José Morán-Meza, Khaled Kaja

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Frequent Collaborators

4 joint publications

Loïc Crouzier

3 joint publications

Nicolas Feltin

3 joint publications

François Piquemal

2 joint publications

Khaled Kaja