François Piquemal

5PUBLICATIONS
14CO-AUTHORS
Circuits and systemsPowder and particle technologyNanoscale characterisationElemental semiconductorsCondensed matter characterisation technique development
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Publications (5)

|Jul 27, 2026
Towards standardization of conductive atomic force microscopy.

|Dec 24, 2025
Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study-Sample Preparation and Stability Issues.

Lydia Chibane, Alexandra Delvallée, Nolwenn Fleurence

|Nov 30, 2023
A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements.

François Piquemal, Khaled Kaja, Pascal Chrétien

|Nov 27, 2021
Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy.

Damien Richert, José Morán-Meza, Khaled Kaja

|Apr 03, 2021
Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy.

François Piquemal, José Morán-Meza, Alexandra Delvallée

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Frequent Collaborators

3 joint publications

Alexandra Delvallée

3 joint publications

Khaled Kaja

2 joint publications

José Morán-Meza

2 joint publications

Christian Ulysse