Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.8K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.8K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study-Sample Preparation and Stability Issues.

Nanomaterials (Basel, Switzerland)·2025
Same author

Atomic force microscopy as a multimetrological platform for energy devices.

Nanoscale·2025
Same author

Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM.

Nanomaterials (Basel, Switzerland)·2024
Same author

Characterisation of titanium dioxide (nano)particles in foodstuffs and E171 additives by <i>single particle</i> inductively coupled plasma-tandem mass spectrometry using a highly efficient sample introduction system.

Food additives & contaminants. Part A, Chemistry, analysis, control, exposure & risk assessment·2024
Same author

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements.

Beilstein journal of nanotechnology·2023
Same author

Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles.

Nanomaterials (Basel, Switzerland)·2023

Related Experiment Video

Updated: Nov 10, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.3K

Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy.

François Piquemal1, José Morán-Meza1, Alexandra Delvallée1

  • 1Laboratoire National de Métrologie et d'Essais (LNE), 78197 Trappes, France.

Nanomaterials (Basel, Switzerland)
|April 3, 2021
PubMed
Summary
This summary is machine-generated.

This study quantifies uncertainty in nanoscale capacitance measurements using scanning microwave microscopy (SMM). Researchers established a 3% uncertainty budget for traceable capacitance measurements, improving calibration methods.

Keywords:
calibration methodmicro-capacitornanoscale capacitance measurementsreference samplescanning microwave microscopyuncertainty budget

More Related Videos

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

10.0K
Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
11:30

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Published on: March 6, 2017

11.9K

Related Experiment Videos

Last Updated: Nov 10, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.3K
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

10.0K
Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
11:30

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Published on: March 6, 2017

11.9K

Area of Science:

  • Electrical Metrology
  • Materials Science
  • Nanotechnology

Background:

  • Reference samples are crucial for calibrating nanoscale electrical measurements in techniques like scanning microwave microscopy (SMM).
  • Current calibration samples lack established traceability, limiting the reliability of capacitance and dielectric constant measurements.
  • Uncertainty in these measurements hinders accurate material characterization and device performance evaluation.

Purpose of the Study:

  • To investigate and quantify error sources affecting capacitance measurements on reference calibration samples.
  • To establish a comprehensive uncertainty budget for traceable capacitance measurements in SMM.
  • To propose improvements for classical calibration methods and suggest new designs for traceable reference standards.

Main Methods:

  • Detailed analysis of potential error sources impacting capacitance measurements on reference samples.
  • Development of a comprehensive uncertainty budget incorporating various influencing factors.
  • Experimental capacitance measurements supported by numerical simulations.
  • Evaluation of uncertainty contributions across different capacitance values and sample dimensions.

Main Results:

  • A combined uncertainty of 3% (at one standard deviation) was achieved for capacitance measurements from 0.2 fF to 10 fF.
  • This uncertainty level is attainable even with unshielded probes.
  • The relative importance of different uncertainty sources was found to vary with measured capacitance values and dimensions.

Conclusions:

  • The study provides a traceable uncertainty budget for nanoscale capacitance measurements, significantly enhancing measurement reliability.
  • The findings offer practical improvements to existing scanning microwave microscopy calibration techniques.
  • New designs for traceable reference standards are proposed, paving the way for more accurate dielectric property measurements.