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Pascal Chrétien

1PUBLICATIONS

6CO-AUTHORS

Nanoscale characterisation

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Publications (1)

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|Nov 30, 2023

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements.

François Piquemal, Khaled Kaja, Pascal Chrétien

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Frequent Collaborators

1 joint publications

François Piquemal

1 joint publications

Khaled Kaja

1 joint publications

José Morán-Meza

1 joint publications

Frédéric Houzé

1 joint publications

Christian Ulysse

1 joint publications

Abdelmounaim Harouri

Frequent Collaborators

1 joint publications

François Piquemal

1 joint publications

Khaled Kaja

1 joint publications

José Morán-Meza

1 joint publications

Frédéric Houzé

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