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Updated: Jun 28, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
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ATNet:用于DIP芯片的X射线图像的缺陷检测框架

Renbin Huang1, Daohua Zhan1, Xiuding Yang1

  • 1School of Mechanical and Electrical Engineering, Guangdong University of Technology, Guangzhou 510006, China.

Micromachines
|July 29, 2023
PubMed
概括

这项研究引入了一个新的深度学习模型,ATNet,用于使用X射线成像进行增强的芯片缺陷检测. ATNet显著提高了识别缺陷的准确性和速度,提高了生产质量.

关键词:
一些X射线图像.在这里,我们可以看到芯片芯片芯片芯片.深度学习是一种深度学习.缺陷 缺陷 缺陷 缺陷 缺陷

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