使 (STEM-EELS)

Nicolas Dumaresq1, Nicolas Brodusch1, Stéphanie Bessette1

  • 1Department of Materials Engineering, McGill University, Montreal, Quebec, Canada.

Ultramicroscopy
|April 28, 2024
PubMed
概括

低压电子能量损失光谱学 (EELS) 在离子电池化合物等材料中最大限度地减少了电子束损伤. 这种技术使得即使在10 keV时也能够准确量化元素,为无损的材料分析铺平了道路.

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