在基于基因的值切换装置中,局部原子结构变化的机制
Minwoo Choi1, Ha-Jun Sung1, Bonwon Koo1
1Thin Film Technical Unit, Samsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon-si, 16677, South Korea.
Advanced science (Weinheim, Baden-Wurttemberg, Germany)
|June 20, 2024
概括
无形素化物中的值切换与Se-Se缺陷有关. 修改局部结构可以提高选择器设备对3D横杆记忆的性能.
科学领域:
- 材料科学 材料科学 材料科学
- 固态物理 固态物理
- 设备工程 设备工程
背景情况:
- 无形石灰化物是3D横杆记忆中的选择器设备的关键.
- 了解它们的值切换机制受到复杂的局部结构和陷分析挑战的限制.
- 由于不稳定的同极纽带,局部结构在切换后演变.
研究的目的:
- 为了阐明无形素化物中值切换机制.
- 调查局部结构演变和陷动态的作用.
- 为了提高值切换选择器设备的性能.
主要方法:
- 密度功能理论 (DFT) 模拟.密度功能理论 (DFT) 模拟.
- 进行X射线光电谱 (XPS) 分析.
- 陷分析和依赖时间的陷演变研究.
主要成果:
- 值切换基本上与Se-Se同极缺陷的充电状态有关.
- 用合金元素修改局部结构可以提高设备的性能.
- 研究了局部原子结构中的依赖时间的陷进化.
结论:
- Se-Se同极缺陷的充电状态控制着值切换.
- 合金元素和理解陷动态对于优化无形石灰体装置至关重要.
- 这项研究为设计改进的无形石灰基记忆选择器提供了洞察力.
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