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Updated: Sep 18, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

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TEM-EDS微分析:不同电子源,加速电压和检测系统之间的比较

Roberto Conconi1, María Del Mar Abad Ortega2, Fernando Nieto3

  • 1Department of Earth and Environmental Sciences, University of Milano-Bicocca, Piazza della Scienza 4, Milano 2016, Italy; Université de Lille, CNRS, INRAE, Centrale Lille, UMR 8207-UMET-Unité Matériaux et Transformations, Lille F-59000, France.

Ultramicroscopy
|June 24, 2025
PubMed
概括

传输电子显微镜-能量分散光谱 (TEM-EDS) 校准是特定于仪器的. 不同的TEM和EDS系统产生独特的k因子,影响元素定量精度.

关键词:
吸收校正 吸收校正 在能量散射光谱学 能量散射光谱学传输电子显微镜的使用进行X射线微分析.

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