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Updated: Jan 10, 2026

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
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双功能3D纳米打印AFM探针用于相对应的磁性和导电特性

Lukas M Seewald1,2, Robert Winkler1,2, Gerald Kothleitner1,3

  • 1Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, Graz, 8020, Austria.

Small methods
|November 24, 2025
PubMed
概括

研究人员使用3D纳米打印开发了新的双功能磁导探头 (MC-Probes). 这些探测器可以同时进行磁性和电气测量,从而推进原子力显微镜应用.

关键词:
3D纳米打印技术的使用在AFM纳米探测器.这就是CAFMCAFM.MFMFMMFMMFMMFMMFMMFMMFMMFMMFMMFMMFMMFMM相关显微镜的相关显微镜.聚焦的电子束诱导沉积引起的沉积.纳米尺度表征的表征.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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