Related Experiment Video

Updated: Aug 24, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
07:24

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry

Published on: May 6, 2019

Time-of-flight secondary ion mass spectrometry (TOF-SIMS):--versatility in chemical and imaging surface analysis

Rana N S Sodhi1

  • 1Surface Interface Ontario, Department of Chemical Engineering & Applied Chemistry, University of Toronto, 200 College Street, Toronto, Ontario, Canada M5S 3E5.

The Analyst
|May 21, 2004
PubMed

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