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Initial data from the 30-element ORTEC HPGe detector array and the XSPRESS pulse-processing electronics at the SRS,
R C Farrow1, J Headspith, A J Dent
1CLRC, Daresbury Laboratory, Warrington WA4 4AD, UK.
Journal of Synchrotron Radiation
|July 21, 2004
Summary
The first 30-element High-Purity Germanium (HPGe) detector for X-ray Absorption Fine Structure (XAFS) was successfully commissioned. This advanced detector achieved over 10 MHz processed count rates, enabling new data acquisition capabilities.
Area of Science:
- Nuclear instrumentation
- Materials science
- Synchrotron radiation science
Background:
- Development of advanced detectors is crucial for enhancing spectroscopic analysis.
- High-Purity Germanium (HPGe) detectors offer superior energy resolution for X-ray applications.
- Fluorescence X-ray Absorption Fine Structure (XAFS) spectroscopy requires high count rate capabilities.
Purpose of the Study:
- To report the commissioning and performance of the world's first 30-element HPGe detector for fluorescence XAFS.
- To validate the detector's performance with XSPRESS digital pulse-processing electronics.
- To present initial data acquired using the newly commissioned system.
Main Methods:
- Collaborative development of a 30-element HPGe detector by CLRC Daresbury Laboratory and EG&G ORTEC.
- Commissioning of the detector system at the Synchrotron Radiation Source (SRS).
- Utilizing XSPRESS digital pulse-processing electronics for data acquisition and analysis.
Main Results:
- Successful commissioning of the 30-element HPGe detector for fluorescence XAFS.
- Demonstration of processed count rates exceeding 10 MHz with XSPRESS electronics.
- Acquisition and presentation of initial experimental data.
Conclusions:
- The 30-element HPGe detector is a significant advancement for fluorescence XAFS spectroscopy.
- The system demonstrates high performance, capable of handling high count rates.
- The presented data showcase the potential of this new detector for future research.