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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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An X-ray nanodiffraction technique for structural characterization of individual nanomaterials

Y Xiao1, Z Cai, Z L Wang

  • 1Experimental Facilities Division, Argonne National Laboratory, Argonne, IL 60439, USA.

Journal of Synchrotron Radiation
|February 25, 2005
PubMed

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