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Atomic force and scanning electron microscopy of atmospheric particles

Zahava Barkay1, Amit Teller, Eliezer Ganor

  • 1Wolfson Applied Materials Research Center, Tel-Aviv University, Ramat Aviv, Israel. barkay@post.tau.ac.il

Summary

Atomic force microscopy (AFM) and scanning electron microscopy with energy dispersive spectroscopy (SEM-EDS) provide detailed atmospheric particle analysis. AFM

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