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Phase retrieval in digital speckle pattern interferometry by application of two-dimensional active contours called

Alejandro Federico1, Guillermo H Kaufmann

  • 1Física y Metrología, Instituto Nacional de Tecnología Industrial, P.O. Box B1650WAB, B1650KNA San Martin, Argentina. federico@inti.gov.ar

Applied Optics
|April 4, 2006
PubMed
Summary

This study introduces a new method for phase map retrieval in digital speckle pattern interferometry using fringe orientation analysis. The technique accurately reconstructs phase information from single fringe patterns.

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