Tungsten nanotip fabrication by spatially controlled field-assisted reaction with nitrogen

In this report we present a straightforward new technique for fabricating nanotips. This approach is based on spatially controlling the reaction of nitrogen gas with the surface atoms of a tungsten tip in a field ion microscope (FIM). Confining this field-assisted etching reaction to the shank has enabled us to produce single-atom tips with an apex radius far sharper than the nominal 10 nm radius of curvature tips we start with. Tip sharpening is evidenced in several ways. The FIM imaging voltage drops dramatically from, typically, 4.4 to 1.6 kV. Nanotip formation is also evident from the increase in the FIM magnification and the decrease in the apex area, which are monitored throughout the experiment. A subsequent field evaporation allows the nanotip to be sequentially deconstructed to further describe the extraordinary sharp tip that was formed. We also demonstrate the utility of these nanotips for the scanning tunneling microscope.