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Updated: Aug 7, 2026

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

Quantitative analysis of microstructures by secondary ion mass spectrometry

Douglas Phinney1

  • 1Lawrence Livermore National Laboratory, L-231, P.O. Box 808, Livermore, CA 94551, USA. phinney1@llnl.gov

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 18, 2006
PubMed

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