David Baddeley1, Christian Carl, Christoph Cremer
1Kirchhoff Institut für Physik, Universität Heidelberg, Germany. david.baddeley@kip.uni-heidelberg.de
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This study introduces a new deconvolution method for 4Pi microscopy that corrects for phase shifts in the point spread function (PSF). This technique improves image quality by accurately handling varying optical conditions within samples.
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