Xiquan Cui1, Xin Heng, Jigang Wu
1Department of Electrical Engineering, California Institute of Technology, Pasadena, California 91125, USA. xiqua@caltech.edu
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We developed a new portable beam profiler using a slanted hole array (SHArP). This device achieves high-resolution beam profiling with a novel aperture array on a CMOS sensor, offering improved accuracy for optical measurements.
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