Victor M Bermudez1, Alan D Berry, Heungsoo Kim
1Electronics Science and Technology Division, Naval Research Laboratory, 4555 Overlook Avenue S.W., Washington, DC 20375-5320, USA. victor.bermudez@nrl.navy.mil
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This study characterizes indium tin oxide (ITO) surface functionalization using n-hexylamine and n-octyltrimethoxysilane (OTMS). Surface impurities and reagent adsorption were analyzed, providing insights into ITO surface chemistry.
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