Conditional random surveying for particle deposition on a mica surface

Jianzhong Fu1, Elia V Eschenazi, Kyriakos D Papadopoulos

  • 1Department of Chemical & Biomolecular Engineering, Tulane University, New Orleans, LA 70118, USA.

Summary

This study introduces conditional random sampling for unbiased particle surveys using atomic force microscopy. This method significantly enhances data reliability in microscopic imaging, reducing errors in particle density analysis.

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