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Atom Probe Tomography Analysis of Exsolved Mineral Phases
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Atom Probe Tomography Analysis of Exsolved Mineral Phases

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Review of atom probe FIB-based specimen preparation methods

Michael K Miller1, Kaye F Russell, Keith Thompson

  • 1Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6136, USA. millermk@ornl.gov

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|November 16, 2007
PubMed

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