Study of active millimeter-wave image speckle reduction by Hadamard phase pattern illumination

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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

Gaetan Koers1, Ilja Ocket, Qi Feng

  • 1Lab for Microelectronics and Photonelectronics, Electronics and Information Processing Department, Vrije Universiteit Brussel, Brussels, Belgium. gkoers@etro.vub.ac.be

Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|February 5, 2008
PubMed

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