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Updated: Jul 2, 2026
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Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
A new type of x-ray absorption spectrometer.
1Department of Physics and Engineering Physics, Texas Tech University, Lubbock, Texas 79409, USA.
The Review of Scientific Instruments
|August 1, 1979
Summary
A new single-crystal spectrometer utilizes a microfocus x-ray source for high-resolution x-ray absorption and emission analysis. Preliminary tests demonstrate its effectiveness across a wide range of Bragg angles.
Area of Science:
- Materials Science
- Physics
- Spectroscopy
Background:
- X-ray absorption and emission spectroscopy are crucial techniques for material characterization.
- High-resolution analysis requires sophisticated instrumentation.
- Microfocus x-ray sources offer enhanced spatial resolution.
Purpose of the Study:
- To develop and present a novel single-crystal spectrometer for x-ray absorption and emission.
- To demonstrate the spectrometer's capability for high-resolution analysis.
- To showcase the effectiveness of the setup using preliminary experimental data.
Main Methods:
- A single-crystal spectrometer was designed and assembled.
- A microfocus x-ray source was integrated into the setup.
- The spectrometer was configured to analyze divergent x-rays over a wide range of Bragg angles.
- Preliminary experiments were conducted to validate performance.
Main Results:
- The spectrometer achieves high resolution in analyzing x-ray absorption and emission spectra.
- The covered energy interval is adaptable based on crystal width and geometrical configuration.
- Preliminary experiments confirm the spectrometer's effectiveness.
Conclusions:
- The developed single-crystal spectrometer is a viable tool for high-resolution x-ray spectroscopy.
- The integration of a microfocus x-ray source enhances analytical capabilities.
- The setup shows promise for various applications in materials science and physics.
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