Sample preparation for the quick sizing of metal nanoparticles by atomic force microscopy
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Updated: Jun 30, 2026
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
Published on: September 13, 2020
Alessandra Vinelli1, Elisabetta Primiceri, Marco Brucale
1Department of Biochemistry G. Moruzzi, S3 Center of the National Institute for the Physics of the Matter (CNR), University of Bologna, Bologna, Italy 40126.
Abstract:
Two alternative pretreatment methods for depositing metal nanoparticles on mica for atomic force microscopy (AFM) imaging are presented. The treated substrates are flat and clean, thus they are amenable of use to characterize very small nanoparticles. The methods do not require any instrumentation or particular expertise. As they are also very quick, the need for storage of the prepared substrates is avoided altogether. These proposed methods, which are compared with the results of transmission electron microscopy analysis, allow the quick sizing and characterization of nanoparticles with the atomic force microscope and could thus help expanding the user community of nanoparticle researchers who could use the AFM for their characterization needs.
