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Updated: Jun 29, 2026

Tree Core Analysis with X-ray Computed Tomography
Published on: September 22, 2023
Analysis of computed tomographic imaging spectrometers. I. Spatial and spectral resolution
Nathan Hagen1, Eustace L Dereniak
1Fitzpatrick Institute for Photonics, Duke University, Durham, North Carolina 27708, USA. nhagen@optics.arizona.edu
Computed tomographic imaging spectrometry (CTIS) offers a novel approach to spectral imaging, distinct from traditional methods. This study clarifies CTIS performance, artifacts, and spectral resolution, while optimizing data reconstruction speed.
Area of Science:
- Optics and Photonics
- Image Processing
- Spectroscopy
Background:
- Traditional whisk-broom and push-broom imaging spectrometers have well-understood noise and artifact behaviors.
- Computed tomographic imaging spectrometry (CTIS) presents unique measurement principles, leading to unfamiliar noise characteristics and data artifacts.
- A lack of standardized terminology hinders the discussion of resolution and performance in CTIS instruments.
Purpose of the Study:
- To review computed tomographic imaging spectrometry (CTIS) measurement systems and analyze their performance.
- To establish a vocabulary for discussing resolution in CTIS instruments.
- To illustrate common artifacts in CTIS reconstructed data and provide a practical measure for spectral resolution.
Main Methods:
- Analysis of CTIS measurement systems and data acquisition.
- Illustration and categorization of artifacts in reconstructed CTIS data.
- Development of a rule-of-thumb metric for spectral resolution in CTIS.
- Investigation of computational methods to improve data reconstruction speed.
Main Results:
- Identification and explanation of characteristic artifacts in CTIS reconstructed data.
- Proposal of a practical, rule-of-thumb method for assessing spectral resolution in CTIS.
- Demonstration that redundant projections in raw CTIS images can be ignored without compromising reconstruction quality.
- Significant improvement in data reconstruction speed achieved through optimized projection utilization.
Conclusions:
- CTIS performance analysis and artifact characterization are crucial for instrument development and data interpretation.
- A standardized vocabulary and practical resolution metrics are needed for the CTIS field.
- Optimizing data reconstruction by removing redundant projections offers a viable method for accelerating CTIS data processing.
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